The security-sensitive hardware module contains semiconductor defects.
View on MITREA semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.
While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.
No detection method information available for this CWE.
The network-on-chip implements a firewall for access control to peripherals from all IP cores capable of mastering transactions.
Post-manufacture testing must be performed to ensure that hardware logic implementing security functionalities is defect-free.
No relationship information available for this CWE.
CWE-1248: Semiconductor Defects in Hardware Logic with Security-Sensitive Implications is a Common Weakness Enumeration (CWE) entry maintained by MITRE. The security-sensitive hardware module contains semiconductor defects. A semiconductor device can fail for various reasons. While some are manufacturing and packaging defects, the rest are due to prolonged use or usage under extreme conditions. Some mechanisms that lead to semiconductor defects include encapsulation failure, die-attach failure, wire-bond failure, bulk-silicon defects, oxide-layer faults, aluminum-metal faults (including electromigration, corrosion of aluminum, etc.), and thermal/electrical stress. These defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.
If exploited, CWE-1248 (Semiconductor Defects in Hardware Logic with Security-Sensitive Implications) it can compromise Availability and Access Control, leading to outcomes such as DoS: Instability.
Recommended mitigations for CWE-1248 include: While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free. Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.
CWE-1248 commonly affects Not Language-Specific. Note that weaknesses are often language-agnostic patterns, so secure coding practices apply broadly.
A CWE (Common Weakness Enumeration) like CWE-1248 describes a category of software weakness — the underlying flaw type. A CVE (Common Vulnerabilities and Exposures) identifies a specific, real-world vulnerability in a particular product. In short, a CWE is the kind of mistake, and a CVE is an instance of that mistake being found in software.